摘要
采用化学沉淀法制备了平均粒径约30 nm的TiO2粉料,以聚苯硫醚树脂为基复合纳米无机粉料,结合螺杆挤出与模压等工艺制备了复合介质基板,借助SEM、EDS、DTA-TGA分别对合成的纳米粉料及树脂基复合料进行了微观结构表征与分析,用带状线方法对PPS基无机复合介质基板微波复介电常数进行了测量。获得了相对介电常数为6.0~13.0,且损耗低的高性能新型微波复合介质材料。
The TiO2 powder of average 30 nm in dimension was prepared by chemical deposition method. By the processes of screw extrusion and mode press, poly(p-phenylene sulphide)(PPS)-based nanometer composite dielectric substrates were prepared. Microstructure nano-powder and PPS-based composites were characterized and analyzed by SEM, EDS and DTA-TGA. The microwave complex dielectric constant was measured by strip line method. A novel low loss dielectric composite microwave application has been acquired. Its relative dielectric constant is 6.0~13.0.
出处
《电子元件与材料》
CAS
CSCD
北大核心
2003年第8期7-9,共3页
Electronic Components And Materials
基金
总装备部预研项目(编号51412010101QT6402)
关键词
纳米材料
聚苯硫醚
复合介质
微波测量
nanometer materials
PPS
composite dielectrics
microwave measurement