摘要
用旋涂法实现了多孔硅与聚乙烯咔唑 (PVK)的复合 ,研究了多孔硅 PVK复合体系的光学性能和电学性能。PL谱的测试发现 ,复合体系的PL同时具有多孔硅和PVK的峰。此外 ,在 4 85nm的位置出现了一个新峰 ,讨论了这个峰的来源。Ⅰ Ⅴ特性测试表明 ,多孔硅 PVK异质结与多孔硅相比 ,Ⅰ Ⅴ曲线呈现更好的整流特性 。
The spin coating method was used to assemble porous silicon(PS) with polymer(poly(N\|vinylcarbazole)(PVK)).The optical and electrical properties of the composite of porous silicon and PVK were studied.The PL spectrum of the composite not only showed the peak that belongs to porous silicon but also showed the peak that belongs to PVK.At the same time,a new peak was found locating at λ =485nm.THe origin of this peak was discussed.The Ⅰ Ⅴ characterization of the composite was measured.The results indicated that the Ⅰ Ⅴ properties of porous silicon was improved after coated with a PVK thin film.The reasons for improvement of Ⅰ Ⅴproperties were discussed.
出处
《材料科学与工程学报》
CAS
CSCD
北大核心
2003年第4期507-509,共3页
Journal of Materials Science and Engineering