摘要
Hough变换,是一种在二值图像中检测直线的常用方法。由于它有很高的计算复杂度,所以很难满足实时处理的要求。如果需要检测图像中若干指定方向的直线,则可将Hough变换进行一些简化。文章根据Hough变换的基本理论,提出了一种快速检测二值图像中垂直和水平直线的方法,应用于半导体芯片矩形检测,取得了良好的效果。
Hough Transform is a common method used to extract lines in binary image,but it cannot meet the requirement of realtime processing because of its high complexity in computation. If the lines in the given directions are to be detected, the predigestion algorithm of the Hough Transform can be used. In this paper,based on the basic principles of Hough Transform,a new algorithm is suggested to detect with high speed the vertical and horizontal lines in binary image. The new algorithm is applied to detect the rectangle within the semiconductor chip,and a favorable effect is achieved.
出处
《合肥工业大学学报(自然科学版)》
CAS
CSCD
2003年第4期550-552,共3页
Journal of Hefei University of Technology:Natural Science