摘要
简要介绍利用介电特性进行水果品质无损检测的现状、介电特性的基本概念和主要参数 ,并给出了介质损耗等效模型以及基于介电特性的无损检测装置及试验原理。利用该试验装置在低频段对不同苹果进行了检测 ,结果表明 ,在合适的频段范围内 ,苹果的电特性参数随频率按一定规律变化 。
The actualities of nondestructive inspection of fruit quality by means of dielectric property and the essential idea and parameters of dielectric property were presented briefly. The equivalent model of medium loss, the nondestructive inspection equipment based on dielectric property and the principle of experiment were given. The equipment was used to inspect apples in low frequency and the result showed that in the range of proper frequency, the parameters of apple dielectric property varied with frequency. Therefore the parameters could reflect the quality of apples on the whole.
出处
《无损检测》
2003年第8期420-422,共3页
Nondestructive Testing