摘要
阐述了在大规模集成电路中,由α粒子引起的软误差的两种模式:(1)存储单元模式、(2)位线模式,以及减少α粒子产生的软误差的4种措施。
Text introduced two pattern of soft error in LSI, It was brought by a particle: (1)Location pattem, (2) Location line pattern. And the text introduced the four measures what to reduce the soft error by α particle brought.
出处
《鸡西大学学报(综合版)》
2003年第3期57-58,共2页
JOurnal of Jixi University:comprehensive Edition