多种材料软X光平面镜反射率标定

Reflectance calibration of different material soft X-ray planar mirrors by BSRF

利用北京同步辐射装置(BSRF) 3W1B束线及反射率计靶室,在束流强度40～120mA、贮存环电子能量2GeV专用光运行模式下,做了不同材料掠入射平面镜反射率标定实验。标定过程用高灵敏度无死层的硅光二极管代替X射线二极管(XRD)作探测器,使输出信号提高2～3个量级,可标定能区从150～270eV拓展为50～1500eV能区,对C,Si和Ni材料平面镜给出完整的反射率标定曲线,最终把实验数据与理论计算比对并分析。

Beijing synchrotron radiation facility(BSRF)3W1B beam line with beam current of 40～120 mA, storage ring electron energy of 2 GeV and photon energy of 50～1 500 eV was used to conduct experiments on the reflectance calibration method. The XRD detectors of planar mirror facility were replaced by AXUV100, increasing the rate of signal versus noise by 2 to 3 orders of magnitude, and the calibration region of 150～270 eV has been expanded to be 50～1 500 eV. The reflectivity calibration curves for 5℃, Si and Ni planar mirrors are given, and the values of experiment and calculation are compared and analyzed.