摘要
采用高温固相反应方法制备的BaFBr∶Eu2+粉末样品,未经X射线、真空紫外或紫外光辐照,用波长大于400nm的光激发样品,可观测到Eu2+的390nm发光。样品的电子自旋共振(ESR)谱证实在BaFBr∶Eu2+粉末样品的制备过程中,会产生大量的晶格缺陷,分别为电子和空穴陷阱,它们在光激励发光过程中充当不可缺少的角色。本工作将BaFBr∶Eu2+粉末制成压片,在其一侧制作两个电极,以研究电阻 电压关系、剩余电压随时间的变化以及与电极材料的关系等电学特性。电特性研究结果也表明,样品中有电子和空穴陷阱两类缺陷,BaFBr∶Eu2+的发光,源自激发能通过这两类缺陷向Eu2+的能量传递。
BaFBr∶Eu2+ is a kind of photostimulated luminescence (PSL) material with a wide energyband bigger than 8eV. For BaFBr∶Eu2+ powder samples, without preirradiation of Xray, VUV or UVlight, the radiative transition of Eu2+ ion peaked at about 390nm can be observed, even if the excitation wavelength is longer than 400nm. The electron spin resonance (ESR) spectrum reveals that there are both electron and holetype traps in powder samples, which play an important role in the PSL process of BaFBr∶Eu2+. The slice of BaFBr∶Eu2+ powder was fabricated under pressure. Two electrodes were evaporated or glued on the surface of slices, so that we can study the electrical properties of BaFBr∶Eu2+, such as the relationship between resistance and voltage, variation of remainder voltage with time and effect of electrode material on it. When a direct current voltage is applied between two electrodes on slices, we have found that at the interface between BaFBr slice surface and electrodes, there exists charge carrier accumulating as a result of the potential barriers, and when the applied voltage was canceled, we can also detect the remainder voltage due to the residual carrier at the interface. The remainder voltage will be decreased with time. When the applied voltage between two electrodes of samples was changed, from higher value to lower one or in inverse direction, the IV curves, therefore the relationship between resistance and voltage, are different. For different materials of electrode, such as Ag or Cu, if applied voltages are low, the remainder voltage is almost a constant which is only related to the material of electrodes, but, when the applied voltage is high enough, the remainder voltage will decrease with the increase of applied voltage. We believe that this phenomenon might result from the penetration of charge carriers through potential barriers under high applied voltages. The investigation results of electrical properties of BaFBr∶Eu2+ show that there exist both electron and hole traps in BaFBr∶Eu2+. The trapped electrons and holes are first escaped to conduction band or valence band, and then transported, respectively, to excited or fundamental levels of Eu2+ ion. As a result, the Eu2+ will be excited and its radiative recombination can be observed.
出处
《发光学报》
EI
CAS
CSCD
北大核心
2003年第4期399-402,共4页
Chinese Journal of Luminescence
基金
国家自然科学基金资助项目(59372093)