数字VLSI电路测试技术-BIST方案

A built-in self-test technology of digital VLSI circuits

分析了数字VLSI电路的传统测试手段及其存在问题,通过对比的方法,讨论了内建自测试(BIST)技术及其优点,简介了多芯片组件(MCM)内建自测试的目标、设计和测试方案。

The traditional testing means and their disadvantages are analysed. The advantagesand means of built-in self-test(BIST) are exhaustively discussed. At last, a multi-chip module(MCM)BIST scheme is briefly introduced by comparison.