期刊文献+

碳化硅宽带隙半导体材料生长技术及应用(英文)

The growth methods and applications of wide band-gap semiconductor SiC
下载PDF
导出
摘要 概括了宽带隙半导体材料碳化硅的主要特性及生长方法,介绍了其在微电子及光电子领域的应用,并对其发展动态及存在问题进行了简要评述。 The main characteristics and growth methods of SiC materials are s ummarized.Its applications in the fields of microelectronics and optoelectronic s are also introduced.The trends of the development of SiC materials and the e xisting problems are appraised and commented.
出处 《微纳电子技术》 CAS 2003年第9期39-43,共5页 Micronanoelectronic Technology
关键词 碳化硅 宽带隙半导体材料 生长技术 光电子学 微电子 wide band-gap semico nductor SiC optoelectronics CLC number:TN304.24Document code:A Articl e ID:1671-4776(2003)09-0039-05
  • 相关文献

参考文献2

二级参考文献22

  • 1EPSTEIN A H,et al.Micro-heat engines,gas turbines,and rocket engines-The MIT microengine project-[C],in Proc.28th AIAA Fluid Dynamics Conf,4th AIAA Shear Flow Control Conf,Snowmass Village,CO,USA,June 29-July 2 1997,AIAA 97-1773.
  • 2BERTHOLD A,et al.All-glass microstructures for biochemical analysis systems [C],Proc.Eurosensors XIII Conf.,The Hague,Netherlands,1999,(9): 975-978.
  • 3MUELLER J.Thruster options for microspacecraft: A review and evaluation of existing hardware and emerging technologies[C],in Proc.33rd AIAA/ASME/SAE/ASEE Joint Propulsion Conf.Exhibit,Seattle,WA,USA,July 6-9,1997,AIAA97-3058.
  • 4SUNDARARAJAN S,et al.Micro/nanotribological syudies of polysilicon and SiC filmsfor MEMS applications [J],Wear 217(1998) 251-261.
  • 5RAJAN N,et al.Effect of MEMS-compatible thin-film hard coatings on the erosion resistance of silicon micromachined fuel atomizers [J],Surface and Coatings Technology,1998,108/109: 391-397.
  • 6CHANDRA K,THESIS M S.Case Western Reserve University,1997.
  • 7TANAKA S,et al.Silicon carbide micro-reaction-sintering using micromachined silicon molds [J],Journal of Microelectromechanical Systems,2001,10 (1):
  • 8KROTZ G,et al.Micromachining applications of heteroepitaxially grown β-SiC layers on silicon [J].Proc.Int Conf on SiC and Related Materials,Kyoto,Japan,1995,829-832.
  • 9MEHREGANY M.http: ∥mems.eeap.cwru.edu/SiC/Pages/devices,html.
  • 10GOURBEYRE C,et al.SiC thin film characterization and stress measurements for high temperature sensors applications,MRS '98 Fall Meeting [C],Boston,MA,USA,Nov.30-Dec.4,1998,Book of Abstracts,AA4.3,full paper to be published in MRS proceedings series,546: 500.

共引文献19

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部