摘要
近20年来,为了解决结构日益复杂的电路测试问题,可测试性技术得到了迅速发展。在可测试性技术中,针对不同的测试对象,如何对可测试性设计方案以及测试策略进行优化,降低总体代价,是非常重要且亟待解决的问题。本文应用图论对可测试性技术中的两类典型优化问题进行了描述,并讨论了其最优解的求解过程。鉴于最优解的求解过程过于复杂,为便于工程应用,本文基于"贪婪"策略,分别构造了求解两类问题快速解法,并通过简单实例予以了验证。
During the last two decades, in order to solve the test problem of complex electronic system, the concept of testability had been accepted by more and more researchers and engineers, its techniques had also been developed very quickly. In testability, how to optimize the design and test approach of various systems to reduce the total cost is very important. In this paper, applying graph theory, we built up the topological description model of two typical optimization problem in testability, discussed its solving process and difficulty. As the optimal solving process is far too complex to practical application, we constructed two fast solving algorithms based on greed approach, which could achieve feasible results through quite shorter solving processes.
出处
《工程数学学报》
CSCD
北大核心
2003年第3期31-35,124,共6页
Chinese Journal of Engineering Mathematics
关键词
可测试性
优化
图论
算法
testability
optimization
graph theory
algorithm
