γ射线诱发染色体畸变的原子力显微镜观察

Structural analysis of γ radiation-induced chromosomal aberrations observed by atomic force microscopy

目的 为寻找辐射损伤新的检测方法 ,用原子力显微镜观察正常及6 0 Coγ射线照射后的染色体结构改变。方法 制备正常及受照射人外周血淋巴细胞染色体标本 ,用原子力显微镜观测染色体的三维结构及其高度变化。结果 正常染色体三维结构及受照射染色体中双着丝粒体结构清晰可见 ,提供的染色体高度数据利于双着丝粒体的识别。结论 原子力显微镜通过高分辨三维成像及线性测量为辐射诱发染色体畸变分析提供了一种新的有价值的检测方法。

Objective To find a new method for the measurement of radiation-induced damage, the structures of normal chromosomes and 60 Co γ-ray-induced chromosomal aberration were analyzed by atomic force microscopy. Methods Normal and irradiated chromosomes of human peripheral blood lymphocytes were prepared, then three-dimensional structure and height of chromosomes were analyzed by atomic force microscopy. Results Three-dimensional structures of normal chromosomes and dicentric aberration in irradiated chromosomes were observed clearly. The data of chromosome height were helpful to recognizing the dicentric aberrations. Conclusion Atomic force microscopy providing three-dimension image and linear measurement is a new and valuable tool for structural analysis of radiation-induced chromosomal aberrations.