摘要
以静电极板为电子束曝光机偏转负载,用双通道扫描原理进行扫描,并使用计算机辅助设计研究电子束曝光机聚焦偏转系统的结构。由SDS-3电子束曝光机试验结果表明,复合静电偏转可以达到磁偏转相似的像差水平。
Using the electrostatic plates as the load of the Ebeam deflection system and the double channels scanning the structure of the Ebeam column is analyzed with CAD. The experimental results of SDS-3 Ebeam lithography machine show that the aberrations of the electrostatic deflection are in the same order of the magnetic deflection.
出处
《微细加工技术》
2003年第3期1-4,8,共5页
Microfabrication Technology