摘要
在对描述器件边界扫描特性的BSDL语言进行了深入研究之后,将其应用于边界扫描自动测试图形生成ATPG与故障诊断软件中。本文以EPM7128SL84芯片为例,说明了其BSDL描述在边界扫描测试程序中的应用方法与要点。
The BSDL language that describes boundary scan components is thoroughly studied,and then applied to boundary scan ATPG tools and fault diagnosis software. The method and mainpoint about the use of BSDL description in a boundary_scan test is given as an example for bound-ary-scan device EPM7128SL84.
出处
《半导体技术》
CAS
CSCD
北大核心
2003年第10期42-45,50,共5页
Semiconductor Technology
