期刊文献+

耐高压大电流IGBT管芯的设计与工艺关键技术研究

Design and Key Technologies of Withstanding High Voltage and Current Stressing Insulated Gate Bipolar Transistor(IGBT)
下载PDF
导出
摘要 IGBT广泛应用于电子、新能源、铁路交通、智能电网等领域.由于难以克服IGBT关键的减薄工艺与背面集电极工艺难题,1 200 V以上的耐高压IGBT领域还是少有产品问世.文章主要研究1 700 V高压的IGBT管芯结构设计和制造的关键工艺,包括双面深结扩散工艺、背面透明集电极工艺、结终端结构设计及版图设计等.这些关键技术的应用提升了IGBT管芯的耐高压性能和工作稳定性、可靠性. Insulated Gate Bipolar Transistor(IGBT) has been widely applied in electronics,new resources of energy,railway communication,smart grids and other fields.Few withstanding high voltage 1200V IGBT products are available for the key technology problems of reducing the thickness and back collector regions.The paper studied the design and key technologies of withstanding high voltage and current stressing Insulated Gate Bipolar Transistor(IGBT),covering the duplicated deep knot diffusion process,back clearlook collector regions technology,and the ends of knots design and layout design.The application of the key technologies helps improve the withstanding high voltage and its working stability and reliability.
出处 《绍兴文理学院学报》 2014年第8期4-8,共5页 Journal of Shaoxing University
关键词 IGBT 双面深结扩散 背面透明集电极 结终端结构 IGBT duplicated deep knot diffusion process back clearlook collector region the end of knot design and layout
  • 相关文献

参考文献2

二级参考文献11

  • 1王兆安 黄俊.电力电子技术[M].北京:机械工业出版社,2002..
  • 2张立.现代电力电子技术基础[M].北京:高等教育出版社,2003.
  • 3西安电力电子技术研究所编.IGCT器件的应用及发展前景[G]//最新功率器件专集.第二集,2001.
  • 4Withanage R, Crookes W, Shammas N. Novel voltage bal- ancing technique for series connection of IGBTs: proceed- ings of european power electronics and applications confer- ence[ C ]. Aalborg, Denmark, 2007 : 1-10.
  • 5Bin Lu, Sharma S K A. Literature review of IGBT fault di- agnostic and protection methods for power inverters [ J ]. IEEE Transactions on Industry Applications, 2009, 45 (5) : 1770-1777.
  • 6Rothenhagen K F. Performance of diagnosis methods for IGBT open circuit faults in three phase voltage source in- verters for AC variable speed drives : proceedings of europe- an power electronics and applications conference [ C ]. Dresden, Germany, 2005 : 7-16.
  • 7Rodrfguez B M A,, Claudio S A, Theilliol D, et al. A fail- ure detection strategy for IGBT based on gate-voltage be- havior applied to a motor drive system [ J ]. IEEE Transac- tions on Industrial Electronics, 2011, 58 (5) : 1625-1633.
  • 8Ohkami T, Souda M, Saito T, et al. Development of a 40 kV series-connected IGBT switch: proceedings of power conversion conference [ C ]. Nagoya, Japan, 2007 : 1175-1180.
  • 9Bhalla A, Shekhawat S, Gladish J, et al. IGBT behavior during desat detection and short circuit fault protection: proceedings of the 10th international symposium on power semiconductor devices and ICs [ C ]. Kyoto, Japan, 1998 : 245 -248.
  • 10John V, Bum S S, Lipo T A. Fast-clamped short-circuit pro- tection of IGBTs [ J ]. IEEE Transactions on Industry Appli- cations, 1999, 35(2) : 477-486.

共引文献12

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部