电应力加速退化试验技术及可靠性评估研究

Research on electrical-stress accelerated degradation test technique and reliability assessment method

为探究电冲击对电子装备寿命的影响,选取电源通断瞬间产生的高压为电冲击加速应力,并以雷达某系统功能电路板为研究对象,开展电应力加速退化试验。通过对试验数据的统计分析,得到基于性能退化轨迹的伪失效寿命,并在Weibull分布条件下进行参数估计,提出基于电应力的电源开关通断电加速模型,并实现对某型雷达功能电路板的可靠性评估。

In order to explore the impact of electric shock to electronic equipment lifetime,high voltage which generates instantaneously in switching power was selected as the accelerated stress of electric shocks and accelerated degradation test was conducted taking PCB of certain type radar as the experimental subject. The pseudo-failure lifetime based on analysis of degradation path of performance degradation was obtained by the experiment,and parameter estimation was carried out in the Weibull distribution. The acceleration model under the power on-off mode based on electrical-stress was proposed,and an example of a radar circuit board was provided to complete reliability assessment of electronic products.