诊断X射线曝光时间非介入式测量研究

Study on non intrusive exposure time measurement of diagnostic X ray

曝光时间是诊断X射线的重要参数之一,根据半导体探测器体积小、灵敏度高及响应快等特点,研制一种用于非介入式测量曝光时间等参数的测量仪,建立诊断X射线曝光时间测量模型,并给出曝光时间非介入式测量的电路构成和软件流程。实验表明:研制的诊断X射线多参数测量仪适用于曝光时间的非介入式测量和校准。

The exposure time is one of the important parameters of diagnostic X ray. According to the characteristics of the semiconductor detector's small size,high sensitivity and rapid response,a kind of instrument for non-intrusive measurement of exposure time and other parameters was developed,then a exposure time measurement model for diagnostic X ray was built, and circuit with its software flow for non-intrusive exposure time measurement was given. The test results show that the instrument for measurement of diagnostic X ray's multi parameter developed is suitable for non-intrusive measurement and calibration of the exposure time.