精神分裂症不同亚型的脑电图对比研究

Research of EEG on schizophrenic patients of different subgroups

目的:研究精神分裂症两个不同亚型(缺陷型与非缺陷型)患者在脑电图(EEG)方面的差异。方法:采用国产ND—16C型16道自动分析EEG仪对69例精神分裂症患者进行标准EEG描记,并对结果进行分析。结果:缺陷型精神分裂症的EEG异常率明显高于非缺陷型精神分裂症,二者差异有统计学意义(P<0.01)。结论:提示缺陷型与非缺陷型精神分裂症患者相比,缺陷型患者有更明显的病理性生物学基础。

Objective To study whether there were differences of the EEG between defect subgroup and non-defect subgroup patients of schizophrenia.Methods We carried standard EEG records on 69 cases of schizophrenic patients by ND-16C type EEG automatically analyzing machine made in China.Results The rate of the abnormal EEG in defect subgroup was significantly higer than that in non-defect subgroup(P<0.01).Conclusion Comparing to non-defect subgroup,defect subgroup schizophrenic patients have more pathological changes.