辅助积分球开口壁厚对双球法测量漫反射比的影响及修正

The Thickness Influence of Auxiliary Integrating Sphere Port to Reflectance Results with Auxiliary Integrating Sphere Method and its Modification

采用双球法复现O/d几何条件的光谱漫反射比时 ,从理论上讲 ,仅与辅助积分球开口与内壁面积 ,以及积分球与平板样品的相对光电读数有关 ,但是实际上 ,双球法的计算公式在推导过程中隐含了诸多假设和约束条件。当实际测量条件与理想状态有偏离时 ,必须对这种偏离产生的影响加以修正才能获得准确的结果。本文着重分析辅助积分球开口边缘厚度对测量结果的影响 ,论述了修正方法 ,建立了数学模型 ,并通过国家实验室的比对表明 ,修正是有效的。

To realize spectral reflectance in 0/d geometric condition with auxiliary integrating sphere method,we only need to knew total inner area and port area of auxiliary integrating sphere,and the reflection signal ratio of flat sample and auxiliary integrating sphere with the same material.When discrepancies from ideal condition are existed in the measurement process,modifications must be done to the results.In this letter,the thick influence of auxiliary integrating sphere port to reflectance results has been discussed.A math model for modifying flux loss ratio caused by the thick influence has been set up.A compression has been done to verify the results.