线状锗等离子体X射线线谱的时间分辨测量

TIME-RESOLVED MEASUREMENTS OF X-RAY LINES EMITTED FROM LINE-PLASMAS OF GERMANIUM

用自行研制的X射线条纹晶体谱仪首次测量了线状锗等离子体的X射线时间分辨谱。给出了类Ne-锗L线共振线的时间演化过程,并用类Ne-锗L线共振线与其双电子俘获伴线的相对强度比粗估了锗等离子体的电子温度及其随时间的变化,实验给出了X光激光增益区介质的电子温度为400～760eV,同时给出了电子温度保持相对恒定的时间不小于90ps(电子温度变化小于2％)。

An x -ray streaked crystal spectrometer developed by ourselves was first used to measure time-resolved x -ray spectra from line -plasmas of Ge. The time evolutions of the resonance lines of the Ge L -shell spectra were obtained. Also, the electron temperature and its time evolution have been deduced by means of the line -intensity -ratio of the dielectronic capture satellite lines to the resonance lines of the Ge L -shell spectra. The electron temperature in the gain region is approximately 400 - 760eV , and the period having the relative constant electron temperature is at least 90ps (the variation of the electron temperature is less than 2% ).