摘要
介绍了DMY-1型膜厚测量仪的原理与设计,给出了不同情况下膜层厚度测量公式,并对该仪器进行了实验,该仪器的测量精度:对于较薄膜为±2nm,对一般膜层为被测厚度的±2%~±5%。
This paper describes the principle and design of the DMY-1 film thickness measuring instrument. Equations for film thickness measurement under different conditions are presented. Experiments were made with this instrument, providing an accuracy of ±2 nm for thinner film and ±2% -±5 % of thickness for thick film.
出处
《清华大学学报(自然科学版)》
EI
CAS
CSCD
北大核心
1992年第2期26-34,共9页
Journal of Tsinghua University(Science and Technology)
关键词
膜厚测量
分光光度法
CCD
film thickness measurement, spectrophotometry, holographic concave grating, CCD device