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微机电系统(MEMS)的干涉测量方法的研究进展

The study of measuring MEMS by interferometry method
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摘要 目前大量的机械系统中应用了微电子机械设备 ,从而对微机电系统 (MEMS)的测量提出了新的要求。 Recent technological trends based on miniaturization of mechanical devices to the microscopic scale,have lead to the development of MEMS.In turn,MEMS require the use of state-of-art test and measurement methodologies.In this paper,we discuss test methods for MEMS by using interferometry.
作者 吕捷 王鸣
出处 《激光杂志》 CAS CSCD 北大核心 2003年第5期4-6,共3页 Laser Journal
关键词 微机电系统 MEMS 干涉测量 测量方法 激光干涉 光干涉平台 MEMS,measurement,interferometry
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参考文献15

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