摘要
目前大量的机械系统中应用了微电子机械设备 ,从而对微机电系统 (MEMS)的测量提出了新的要求。
Recent technological trends based on miniaturization of mechanical devices to the microscopic scale,have lead to the development of MEMS.In turn,MEMS require the use of state-of-art test and measurement methodologies.In this paper,we discuss test methods for MEMS by using interferometry.
出处
《激光杂志》
CAS
CSCD
北大核心
2003年第5期4-6,共3页
Laser Journal