摘要
基于忆阻器在电路中具有记忆的特性,借助于PSPICE软件进行忆阻器模型以及基于忆阻器的突触电路的建立与仿真。利用磁控溅射方法在Si衬底上制备NiO忆阻器实物。电学测试结果发现,该忆阻器的电阻随着电压的变化而变化,得到了典型的V-I滞回特性曲线。将NiO忆阻器实物连接到突触的硬件电路中,实物测试结果显示出与基于忆阻器的突触仿真电路同样的LTP效应和LTD效应,进一步证实该硬件电路中存在突触可塑性。
In view of the memristor memory in the circuit,the memristor model and synaptic circuits based on memristor are built and simulated by means of PSPICE.The NiO memristor film is successfully prepared on the Si substrate by magnetron sputtering method.The electrical test shows that the resistance of memristor changes with the voltage,displaying the typical V-I characteristic hysteresis curve.The hardware test shows the same LTP and LTD effects when NiO memristor is connected to the synaptic hardware circuit,which further proves the existence of synaptic plasticity.
作者
高畅
李彤
李泉
王铁钢
范其香
倪晓昌
GAO Chang;LI Tong;LI Quan;WANG Tie-gang;FAN Qi-xiang;NI Xiao-chang(School of Electronics Engineering,Tianjin University of Technology and Education,Tianjin 300222,China;School of Mechanical Engineering,Tianjin University of Technology and Education,Tianjin 300222,China)
出处
《天津职业技术师范大学学报》
2019年第2期33-38,共6页
Journal of Tianjin University of Technology and Education
基金
国家自然科学基金资助项目(51301181)
天津市应用基础与前沿技术研究计划重点项目(15JCZDJC39700)
天津市科技特派员项目(16JCTPJC49500)
天津市高等学校创新团队培养计划资助项目(TD12-5043)
天津职业技术师范大学人才计划资助项目(RC14-53)