期刊文献+

A Novel RRAM Based PUF for Anti-Machine Learning Attack and High Reliability

A Novel RRAM Based PUF for Anti-Machine Learning Attack and High Reliability
原文传递
导出
摘要 Due to the unique response mechanism, physical unclonable function(PUF) has been extensively studied as a hardware security primitive. And compared to other PUFs, the resistive random access memory(RRAM)based PUF has more flexibility with the change of conductive filaments. In this work, we propose an exclusive or(XOR) strong PUF based on the 1 Kbit 1-transistor-1-resistor(1 T1 R) arrays, and unlike the traditional RRAM based strong PUF, the XOR PUF has a stronger anti-machine learning attack ability in our experiments. The reliability of XOR RRAM PUF is determined by the read instability, thermal dependence of RRAM resistance,and aging. We used a split current distribution scheme to make the reliability of XOR PUF significantly improved.After baking for 50 h at a high temperature of 150?C, the intra-chip Hamming distance(Intra-HD) only increased from 0 to 4.5%. The inter-chip Hamming distance(Inter-HD) and uniformity are close to 50%(ideally). And it is proven through the NIST test that XOR PUF has a high uniqueness. Due to the unique response mechanism, physical unclonable function(PUF) has been extensively studied as a hardware security primitive. And compared to other PUFs, the resistive random access memory(RRAM)based PUF has more flexibility with the change of conductive filaments. In this work, we propose an exclusive or(XOR) strong PUF based on the 1 Kbit 1-transistor-1-resistor(1 T1 R) arrays, and unlike the traditional RRAM based strong PUF, the XOR PUF has a stronger anti-machine learning attack ability in our experiments. The reliability of XOR RRAM PUF is determined by the read instability, thermal dependence of RRAM resistance,and aging. We used a split current distribution scheme to make the reliability of XOR PUF significantly improved.After baking for 50 h at a high temperature of 150?C, the intra-chip Hamming distance(Intra-HD) only increased from 0 to 4.5%. The inter-chip Hamming distance(Inter-HD) and uniformity are close to 50%(ideally). And it is proven through the NIST test that XOR PUF has a high uniqueness.
作者 DAI Lan YAN Qiangqiang YI Shengyu LIU Wenkai QIAN He 戴澜;闫强强;易盛禹;刘文楷;钱鹤(Academy of Electronic Information Engineering, North China University of Technology;Institute of Microelectronics, Tsinghua University)
出处 《Journal of Shanghai Jiaotong university(Science)》 EI 2019年第1期101-106,共6页 上海交通大学学报(英文版)
基金 the Special Research Fund for the National Science Foundation of China(Nos.61674087 and61674092) the Foundation of Beijing Innovation Center for Future Chip(No.KYJJ2016007)
  • 相关文献

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部