色谱图拟合及重叠峰快速分离解析

A Method of Fitting and Quick Resolution of Skewed and Overlapped Chromatographic Peaks

本文以EMG分布函数作为色谱峰的数学模型,提出由柱系统的半峰宽规律与峰态偏斜度D计算EMG参数的连环公式,用于快速谱图拟合和重叠峰分解。实验表明校正后的峰面积和拟合精度令人满意;不用半峰宽规律,直接采用优化方法解谱也取得好的结果。

Taking EMG function as a mode! of skewed chromatographic peak,a set of sequential equations which can be used to ca'culare the model parameters from skew index (D) and so called 'half-width rule' of a column system were developed. The experiments show that these equations can effectively be used for fitting and quick resolution of the skewed and overlapped peaks. An optimization process of the EMG parameters based on the sequential equations was described for getting more accurate and precise peak area in the resolution of overlapped, peaks.