摘要
用磁控溅射法制备了不同Mn含量的PdMn Co磁性多层膜 ,通过x射线衍射对该多层膜系列进行结构分析 ;测定了不同Mn含量系列样品的磁滞回线、垂直各向异性及磁力显微镜图 ,分析了饱和磁化强度、磁畴和垂直各向异性变化的原因 ;通过测定该多层膜体系的克尔谱 。
Co/Pd1-xMnx multilayers with Mn concentration x = 0 to 20.8% have been sputtered on a glass substrate with 40 nm thick Pd or PdMn buffer. With the combination of small- and large-angle x-ray analyes, the crystal structure of the samples were investigated. Hysteresis loop and perpendicular magnetic anisotropy (PMA) were measured by means of an alternating-gradient magnetometer and magnetic torque. Domain structure was observed by magnetic force microscopy. Saturation magnetization, PMA and the Kerr rotation spectrum of the samples were investigated. It is shown that the change of Kerr rotation with the increase of Mn concentration in Pd could be ascribed to the variation of diagonal and off-diagonal elements of the dielectric tensor.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2003年第10期2616-2621,共6页
Acta Physica Sinica
基金
国家自然科学基金 (批准号 :19774 0 72 )
贵州省科学技术基金 (批准号 :2 0 0 130 78)资助的课题~~