摘要
阐述了湿热环境对电子产品质量寿命的影响,并重点介绍了目前湿热试验的热门话题:离子迁移失 效的机理和试验方法。
The effect of the humid and hot environment on the quality life time of electronic
product is discussed with emphases on the hot topic about humid heat test--the failure
mechanism of ion migration and the test method.
出处
《电子产品可靠性与环境试验》
2003年第5期57-60,共4页
Electronic Product Reliability and Environmental Testing
关键词
环境试验
可靠性
离子迁移
environmental test
reliability
ion migration
