用飞秒光克尔方法测量镶嵌在PVA膜的SnO_2纳米晶簇的三阶光学非线性(英文)

Large Third-order Optical Nonlinearity of SnO_2/PVA Composite Thin Film Measured by Femtosecond Optical Kerr Effect Method

报道了用飞秒光克尔实验系统测量镶嵌在聚乙烯醇 (PVA)薄膜的二氧化锡 (SnO2 )纳米晶簇的光学非线性的实验结果 ,平均粒径为 10nm和 2～ 3nm的SnO2 晶簇的三阶非线性极化率 χ(3)分别为 4 30 1× 10 -14 和 1 72 8× 10 -13esu ,并对其原因进行了分析。实验还表明SnO2 PVA薄膜的光学响应是很快的 ,为 5 0fs。由于聚乙烯醇薄膜的性能稳定 ,易于生产 。

The third-order nonlinear susceptibility χ (3) of SnO 2/PVA composite thin film was measured by a femtosecond time-resolved optical Kerr effect OKE at 810?nm wavelength.The χ (3) observed was 4 301×10 -14 esu for SnO 2 nanoparticles which average diameter is 10?nm and 1 728×10 -13 esu for 2～3?nm SnO 2 nanoparticles.Femtosecond time-resolved OKE measurements revealed that the response time of the optical nonlinearity in SnO 2/PVA thin film is extremely fast as short as 50?fs.