摘要
静电放电产生的电磁脉冲 ( ESD EMP)有上升沿陡、频带宽和峰值大等特点 ,对电子系统的干扰和破坏很大。为考察 ESD EMP对电子系统的影响 ,对单片机系统进行了ESD EMP辐照效应实验 ,着重研究了单片机的外部数据存贮器 RAM在其作用下的各种效应。在效应实验基础上研究了
Electromagnetism pulse produced during electrostatic discharge (ESD EMP) has sharp rise edge, wide frequency band and high peak. It can disturb and destroy the electronic system. In order to review the effects of ESD EMP to the electronic system, the irradiation experiments of ESD EMP on the single chip microcomputer system is made in this paper. The every effects of single chip microcomputer's RAM are studied when RAM is irradiated by ESD EMP. Based on the experiments, the defending methods are studied.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2003年第10期41-43,共3页
High Voltage Engineering