摘要
应用干涉法实现透明膜系反射率的测量。将待测膜系镀在两薄玻璃片,并构成F-P干涉仪,根据透射光谱的自由谱宽和干涉峰的半宽值,计算出膜系反射率,避免了光源波动对测量结果的影响。在实验所用膜系的反射率小于98％时,测量误差小于O.09％。
Using interferometry reflectivity of transparent films is measured. The transparent films are deposited on thin glasses that formed a Fabry-Perot interferometer. The films' reflectivity values to be measured are calculated from the free spectral range and full width at half maximum of transmission spectrum. Thus the measurement error arose from light source power fluctuation is eliminated. The measurement error is less than 0.09% when the reflectivity of film is less than 98% in the experiment.
出处
《光学与光电技术》
2003年第4期39-42,共4页
Optics & Optoelectronic Technology
