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X-Ray and Neutron Diffraction Studies on Thermal Parameters of Thalous Bromide

X-Ray and Neutron Diffraction Studies on Thermal Parameters of Thalous Bromide
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摘要 Thermal parameters of TIBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order reflections, it was not possible to determine the individual thermal parameters. TheX-ray diffraction measurements yielded BT1=0.296(5) nm2 and BBr=0.162(5) nm2. The overall isotropic value, B was 0.252(7) nm2 which is in good agreement with B=0.230(8) nm2 obtained from present neutron diffraction measurements. The present values are also in good agreement with theoretical estimates obtained from the shell models. Thermal parameters of TIBr were determined using both X-ray and neutron diffraction techniques. The data was analysed by Rietveld profile refinement procedure. From the neutron diffraction data, due to weak odd-order reflections, it was not possible to determine the individual thermal parameters. TheX-ray diffraction measurements yielded BT1=0.296(5) nm2 and BBr=0.162(5) nm2. The overall isotropic value, B was 0.252(7) nm2 which is in good agreement with B=0.230(8) nm2 obtained from present neutron diffraction measurements. The present values are also in good agreement with theoretical estimates obtained from the shell models.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2003年第2期189-190,共2页 材料科学技术(英文版)
关键词 Thallium bromide Temperature factors Debye temperature Rietveld refinement Neutron diffraction X-ray diffraction Thallium bromide, Temperature factors, Debye temperature, Rietveld refinement, Neutron diffraction, X-ray diffraction
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