摘要
Using the method of line structure light produced by a laser diode,three dimensional profile measurement is deeply researched.A hardware circuit developed is used to get the center position of light section for the improvement of the measurement speed.A double CCD compensation technology is used to improve the measurement precision. An easy and effective calibration method of the least squares to fit the parameter of system structure is used to get the relative coordinate relationship of objects and images of light section in the directions of height and axis. Sensor scanning segment by segment and layer by layer makes the measurement range expand greatly.
Using the method of line structure light produced by a laser diode, threedimensional profile measurement is deeply researched. A hardware circuit developed is used to getthe center position of light section for the improvement of the measurement speed. A double CCDcompensation technology is used to improve the measurement precision. An easy and effectivecalibration method of the least squares to fit the parameter of system structure is used to get therelative coordinate relationship of objects and images of light section in the directions of heightand axis. Sensor scanning segment by segment and layer by layer makes the measurement range expandgreatly.
