主动式毫米波成像系统对不同材料反射特性分析

Analysis of Different Material Reflection Characteristics Based on Active Millimeter-wave Imaging System

安检系统飞速发展,原有安检设备逐渐不能满足社会需求。毫米波的物理特性使得其相较于X光等更适用于安检成像系统,其中主动式毫米波成像系统相对于被动式毫米波成像系统而言,系统灵敏度较高且受环境影响较小。介绍了一种Ka波段主动式毫米波成像系统及成像原理,并采用了一种新型的校准方法对图像进行修正,最后对不同材料的吸波特性进行了简要分析。

The security inspection system develops quickly, the previous security inspection equipment is gradually unable to meet social requirement. The physical characteristics of the millimeter-wave make it more suitable for security imaging systems than X-rays, and the active millimeter-wave imaging system has a higher sensitivity and is less affected by the environment than a passive millimeter-wave imaging system. This paper introduces a Ka-band active millimeter-wave imaging system and imaging principle, and uses a new calibration method to correct the images. Finally, a brief analysis of the wave-absorbing characteristics of different materials is performed.