大中规模数字电路的测试

Testing for LSI/MSI Digital Circuits

本文介绍一种新型的通用大、中、小规模数字集成电路功能测试仪的组成、工作原理及主要硬、软件的设计。加权伪随机指令序列用于测试各种常用的微处理器。伪随机序列用于测试MSI/SST数字集成电路。确定性图形用于测试LSI接口电路。所有这些功能结合在一个小型的仪器内,因而具有很高的性能/价格比。测试的响应送到并行特征分析器,根据特征码正确与否就可确定被测器件的功能是否正常。

This paper introduces the test principle and construction of a new digital LSI/MSI functional tester. Deterministic testing and random testing methods are adopted. Weighted random instruction series are used to test a variety of microprocessors in common use. Pseudorandom series are used to test MSI/SSI circuits. Deterministic patterns are used to detect the fauits of LSI interfacing circuits. All these functions are organized into a small digital instrument. Therefore it has a high performance/cost ratio. Fault detection can be achieved by comparing the result in the parallel signature analyzer with the value previously determined for the fault-free circuit.