摘要
随着科学技术的发展,集成电路在我国军用武器装备上的应用越来越广泛,其可靠性成为制约我国武器装备质量的一项重要因素,失效分析是集成电路可靠性及质量保证的重要环节,本文从失效分析的流程、方法、技术及发展入手,对军用集成电路的失效模式及失效机理进行了详细的讲解,随着元器件设计与制造技术的不断提高及失效分析技术和工具的逐步完善,失效分析工作将在集成电路质量控制方面发挥更大的作用。
with the development of science and technology,the application of the integrated circuit(IC) in Chinese armament quality,failure analysis is taken as one of the important chain for IC reliability and quality assurance,in view of the flow,method,and development for failure analysis,this thesis explains failure mode and failure mechanism on military IC in detail,with continuous improvement of component design and manufacture technology and gradual perfection of failure analysis technology and tool,failure analysis will play more important role in the light of IC quality control.
出处
《电子测试》
2017年第3X期46-47,54,共3页
Electronic Test
关键词
集成电路
失效分析
电性分析
物理分析
Integrated circuit
Failure analysis
Electrical analysis
Physical anaylysis
