摘要
针对DTHS-A单片机实验平台的日常维护需要设计了该测试装置,该装置能够快速的检测实验电路中驱动芯片是否正常,与传统方法相比,节约了维护的时间,提高了检测效率。该装置以STC15F2K61S2为控制核心,通过按键与拨码开关来选择对应芯片,通过液晶显示与LED指示芯片是否正常,同时具有过流保护功能。
The daily maintenance of DTHS-A MCU experimental platform requires a test device design, the device can detect the experimental circuit of the rapid drive chip is normal, compared with traditional methods, saving the maintenance time, improve the detection efficiency. The device uses STC15 F2 K61 S2 as the control core, selects the corresponding chip through the button and the dial switch, through the LCD display and the LED indicating whether the chip is normaland has the over-current protection function?
出处
《电子测试》
2017年第10X期20-21,共2页
Electronic Test
