基于FPGA的集成电路测试系统设计探讨

Design of integrated circuit testing system based on FPGA

随着集成电路的功能以及各种参数的大量增加,要想保证电路的可靠性,就必须重视集成电路的测试功能,在传统的测试过程中,对集成电路的测试是依靠有经验的测试人员使用信号发生器、万用表和示波器等仪器来进行测试的。这种测试方法测试效率低,无法实现大规模大批量的测试。为此,本文分析了基于FPGA集成电路测试系统的优越性,并选取某集成电路的老化测试系统设计为例进行重点探讨。

With the function of the integrated circuit and the tremendous increase of various parameters, in order to guarantee the reliability of the circuit, we must attach importance to integrated circuit testing capabilities, in the process of the traditional test, test of integrated circuit is rely on experienced testers use signal generator, instruments such as multimeter and oscillograph to test.This test method is inefficient and cannot be tested in large quantities. In this paper, the advantage of FPGA integrated circuit testing system is analyzed, and the design of the aging test system of an integrated circuit is discussed.