摘要
为了充分掌握纳米操纵中的微观摩擦规律,消除微观摩擦对纳米操纵的不利影响,该文利用原子力显微镜(AFM)的超微探针作为操纵工具,对具有优异力学和电学特性的碳纳米管在不同的表面状况下进行了剪切和操纵。实验中发现,当基底的表面成分和表面形貌不同的时候,操纵过程中的微观摩擦力会有明显的变化。从与光刻技术相结合的操纵实验中可以看出,光刻后残留的光刻胶会大大增加碳纳米管与基底间的微观摩擦力,并加剧操纵工具——AFM针尖的污染与磨损。
The microscopic friction during nanomanipulation was studied using the tip of an atomic force microscope to cut and manipulate carbon nanotubes with excellent mechanical and electrical properties for different surface conditions. Experimental results show that the surface chemical composition and the surface topography significantly influence the microscopic friction during nanomanipulation. Manipulation experiments combined with photolithography indicate that after the photolithography, the residual photolithographic glue significantly increases the microscopic friction between the carbon nanotubes and the substrates and also aggravates the contamination and abrasion of the atomic force microscope tips.
出处
《清华大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
2003年第11期1483-1486,共4页
Journal of Tsinghua University(Science and Technology)
基金
国家自然科学基金资助项目(50135040
50173001)
教育部博士点基金资助项目(2000000339)
关键词
碳纳米管
微观摩擦
纳米操纵
表面状况
光刻技术
carbon nanotubes
nanomanipulation
microscopic friction
surface conditions
