表面镀铑对X射线荧光能谱测定白色K金首饰成分含量影响的研究

Surface plated Rh effects the analytical results in ED-XRF analysis of white karat gold jewelery

本文研究表面镀铑对X射线荧光能谱测定白色K金首饰成分含量影响,用一次靶(Rh)测首饰成分含量,用二次靶(Sn)测镀层厚度,系统研究含量与镀Rh层厚度之间函数关系。结果表明随着铑层厚度增加,所测的Au,Ag元素含量将会增加。Cu,Ni元素含量将会减少,因此必须进行修正。

Surface plated Rh effects on the analytical results, in ED-XRF analyris of white karat gold jewelries, the content of An and Ag is increasing, the content of Cu and Ni is discreasing when the thichness Rh coating is increasing.