期刊文献+

CCD等厚干涉实验仪的研究 被引量:3

Study of CCD Equal-Thickness Interferometer
下载PDF
导出
摘要 采用显微光学系统取代读数显微镜,构成新型的CCD等厚干涉实验仪。通过计算机图像处理技术来补偿因视场扩大带来的条纹分辨率降低的影响。实验测试比较显示,CCD等厚干涉实验仪具有实验观察效果好和采集数据更方便的优点。 JXD1 microscope is replaced by CCD micrographic optical system, with that a new type CCD equalthickness interferomenter is composed. The reduction of the resolving power for the micrographs, caused by the enlarged visual field, can be compensated by image processing. The contrasting experiment shows that CCD equalthickness interferometer has strong points of good observable effect and more conveniently collecting data.
出处 《实验室研究与探索》 CAS 2003年第6期55-57,共3页 Research and Exploration In Laboratory
关键词 CCD等厚干涉仪 图像处理 实验装置 显微光学系统 大学 物理实验 干涉条纹 CCD micrographic optical system equal-thickness interferometer image processing
  • 相关文献

参考文献4

  • 1赵万霖 曾金根.大学物理实验教程[M].上海:同济大学出版社,1992.130-135.
  • 2阮秋琪.数字图像处理基础[M].北京:中国铁道出版社,1998..
  • 3许伯强 王纪俊.用现代技术设备改造迈克尔逊干涉仪的性能.大学物理,2000,19(4):10-14.
  • 4盛业华,唐宏,杜培军,郭达志.一种保形的快速图象形态细化算法[J].中国图象图形学报(A辑),2000,5(2):89-93. 被引量:27

二级参考文献1

共引文献27

同被引文献18

  • 1花世群.用劳埃德镜干涉原理进行圆度误差测量[J].中国激光,2004,31(8):1013-1017. 被引量:5
  • 2张燕飞.谈等倾干涉和等厚干涉的异同[J].黄山学院学报,2005,7(3):30-31. 被引量:2
  • 3花世群,骆英,赵国旗.基于单缝衍射原理的圆度误差测量方法[J].光电工程,2007,34(3):140-144. 被引量:3
  • 4Microsoft Corporation. Msdn Libraryhttp://msdn.microsoft. com,2002-06.
  • 5Gonzalez RC, Woods RE.Digital Image Processing.2nd ed.北京:电子工业出版社,2006.
  • 6Grana C, Borghesani D, Cucchiara R. Connected Component Labeling Techniques on Modern Architectures. Image Analysis and Processing,2009,5716:816-824.
  • 7AbuBakerl A, Qahwajil R, Ipsonl S, Saleh M. One Scan Connected Component Labeling Technique. 2007 IEEE International Conference on Signal Processing and Communications (ICSPC 2007), 2007:1283-1286.
  • 8Chang F, Chen CJ. A component-labeling algorithm using contour tracing technique 7th International Conference on Document Analysis and Recognition, 2003:741-745.
  • 9Suzuki K, Horiba I, Sugie N. Linear-time connected- component labeling based on sequential local operations. Computer Vision and Image Understanding, 2003,(89)1: 1-23.
  • 10Kesheng Wu, Ekow Otoo, Kenji. Suzuki. Optimizing two- pass connected-component labeling algorithms.Pattern An- al Applic(2009)12:117-135.

引证文献3

二级引证文献7

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部