面向IP核测试复用的测试环设计

Test wrapper design for IP-core test reuse

提出了一种改进的测试环单元设计.它在传统的P1500测试环单元基础上添加一个多路器,实现了对测试环单元的功能数据路径测试,并解决了测试环扫描链在扫描移位过程中的安全移位问题,同时还可以降低扫描移位过程中产生的动态测试功耗;在分析了两种典型测试环P1500测试环以及飞利浦TestShell测试环的基础上,提出了一种三态测试环结构.该结构允许共用同一条测试总线的不同IP核直接连接到测试总线上.

An improved wrapper cell was presented based on analysis of two kinds of wrapper cells. It adds a mux to the traditional P1500 wrapper cell, which can test the data path of wrapper cells, resolve the problem of safe shifting of scan chains during shifting and reduces the dynamic test power during scan shifting. A kind of wrapper, namely a tri-state wrapper, was put forward based on analysis of two kinds of wrappers; IEEE P1500 wrapper and Philip TestShell. The architecture allows different cores to be connected directly to the same test bus.