期刊文献+

工作气压对氮化硼薄膜场发射特性的影响

Influence of work gas pressure on field emission characteristics for BN thin films
下载PDF
导出
摘要 利用射频磁控溅射方法,在n型(100)Si基底上沉积了氮化硼(BN)薄膜,并在超高真空系统中测量了BN薄膜的场发射特性.研究发现,沉积时工作气压的变化对BN薄膜的场发射特性有很大影响,工作气压为2Pa时沉积的BN薄膜样品的场发射特性较好,其阈值电场为6V/μm,场发射电流为320μA/cm2.F-N曲线表明,在外加电场的作用下,电子是通过隧道效应穿透BN薄膜表面势垒发射到真空的. BN thin films were prepared on the (100)-oriented surface of n-Si by r.f.magnetic sputtering physical vapor deposition(PVD). The field emission characteristics of thin BN films were measured in a super high vacuum system. It is found that the field emission characteristics of thin BN films is affected evidently by total pressure changing. A turn-on electric field as low as 6?V/μm is obtained and the highest emission current density is 320?μA/cm^2 for BN film (deposited) at total work gas pressure of 2?Pa. F-N curves indicate that electrons are transfered from substrate Si to conduction band of BN thin film and are emitted from BN to vacuum (tunneling) through the potential barrier at the surface of the BN thin film under exterior electric field action.
出处 《延边大学学报(自然科学版)》 CAS 2003年第4期246-249,共4页 Journal of Yanbian University(Natural Science Edition)
关键词 工作气压 氮化硼薄膜 场发射 射频磁控溅射方法 冷阴极 BN thin films Field emission Work gas pressure
  • 相关文献

参考文献15

  • 1[1]Krauss A R, Auciello O, Ding M Q, et al. Electron field emission for ultrananocrystallin diamond films[J]. J Appl Phys,2001,89: 2958 - 2967.
  • 2[2]Sugino T, Kuriyama K, Kimura C, et al. Temperature dependence of field emission characteristics of phosphorus-doped polycrystalline diamond films[J ]. Appl Phys Lett, 1998,73:268- 270.
  • 3[3]Ji H, Jin Z S, Gu C Z, et al. Influence of diamond film thickness on field emission characteristics[J ]. J Vac Sci Technol B,2000,18:2710 - 2713.
  • 4[4]Geis M W, Twichell J C, Macaulay J, et al. Electron field emission from diamond and other carbon materials after H2, O2 and Cs treatment[J]. Appl Phys Lett, 1995,67:1328- 1330.
  • 5[5]Mao D S, Wang X, Li W, et al. Electron field emission from a patterned diamond-like carborn flat thin film using a Ti interfacial layer[J]. J Vac Sci Technol B, 2000,18:2420 - 2423.
  • 6[6]Chen C L, Chen C S, Lue J T. Field emission characteristic studies of chemical vapor deposited diamond films[J]. Solid-State Electronic, 2000,44:1733 - 1741.
  • 7[7]Powers M J, Benjamin M C, Porter L M, et al. Observation of a negative electron affinity for boron nitride[J]. Appl Phys Lett, 1995,67:3912 - 3914.
  • 8[8]Sugino T, Etou Y, Tagawa S, et al. Field emission characteristics of boron nitride films[J]. J Vac Sci Technol B(J),2000,18:1089 - 1092.
  • 9[9]Pryor R W. Carbon-doped boron nitride cold cathodes[J]. Appl Phys Lett, 1996,68:1802- 1804.
  • 10[10]Sogino T, Kawasaki S, Tanioka K, et al. Electron emission from boron nitride coated Si field emitters[J]. Appl Phys Lett, 1997,71:2704 - 2706.

二级参考文献1

  • 1Wentzcovitch R M,Phys Rev B,1986年,34卷,1071页

共引文献11

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部