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AGILENT的混合信号测试解决方案 被引量:4

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作者 杨广宇
机构地区 安捷伦科技
出处 《半导体技术》 CAS CSCD 北大核心 2004年第1期49-50,共2页 Semiconductor Technology
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同被引文献14

  • 1许伟达.IC测试原理[J].半导体技术,2006,31(4):284-286. 被引量:7
  • 2许伟达.IC测试原理-芯片测试原理[J].半导体技术,2006,31(7):512-514. 被引量:5
  • 3J750 Basic Prog Course V3.4 Student Training Manu[ M/ CD]. Teradyne Inc 2002 - 8.
  • 4Burns Mark, Roberts Gordon W. An Introduction to Mixed-Sig- nal IC Test and Measurement[M]. New York: OXFORD UNI VERSITY PRESS, 2001 : 147-190.
  • 5Thomas Keasler. The Fundamentals of Mixed Signal Testing [M]. Version :3.1. Florida: Soft Test Inc, 2002 146-205.
  • 6Multisite Arbitrary Waveform Generator Software Instrument for ASL Serial AWG Option Programming Reference and Us- ers Guide [M]. California: Credence Systems Corporation, 2003:16-30.
  • 7ASL 3000 Series Maintenance Training Workbook[M]. Califor nia: Credence Systems Corporation, 2004 : 219 232.
  • 8Thomas Keasler. The Fundamentals of Mixed Signal Testing [M]. Version 3. 1. Florida:Soft Test Inc, 2002..146-205.
  • 9Burns Mark, Roberts Gordon W. An Introduction to Mixed Signal IC Test and Measurement[M]. New York: OXFORD UNIVERSITY PRESS, 2001 : 123-145.
  • 10Audio Video Multisite Digitizer Software Instrument for ASL Serial AVE) Option Programming Reference and Users Guide [M]. California: Credence Systems Corporation, 2003:24-109.

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