换路过渡过程及相关的电子仪器故障分析

The analysis of "circuit-changing" process and related electronic instrument faults

仪器性能达不到原设计技术条件要求的称为故障。故障是从仪器内部和外部电路发生新的"换路"开始,以引起储能元件状态的变化而产生了"过渡过程"结束之后生成。从"换路"的四种情况阐述了造成故障的机理,并定性分析、定量估算过渡过程的方法。

The reason that the designed specifications cannot be reached is faults. The faults start from the 'circuit-changing' of inner and external circuit of instruments, causing the changing of stored-element state, and end with the finishing of 'transient-process'. This article introduces the theory to cause this kind of fault from four aspects, and the methods to analyze 'transient-process' qualitatively and quantitatively are discussed.