粗糙表面轮廓的对角线切片谱分析

Diagonal Slice Spectrum Analysis of Rough Surface Profile

针对双谱估计存在的计算量庞大、估计精度较差、显示不够直观等缺点 ,提出了一种改进的对角线切片谱分析方法 ,并把它用于粗糙表面轮廓的非对称性和耦合性特征分析。实验结果表明 ,该方法简单、合理 ,而且有可能揭示加工过程中引起表面粗糙度间距和高度参数变化的原因。

Bispectrum is an available method to describe quadratic phase coupling, non-linearity and non-symmetry of stochastic signal, whereas its shortcomings are also obvious, such as complex computation, lower estimating exactness, not convenient vision. In this paper, an improved method, diagonal slice spectrum analysis, is presented and used to characterize the asymmetry and coupling of the rough surface. The experimental results show that the diagonal slice spectrum analysis technique is simple, effective and reasonable, and that it is possible to explain the changes of surface roughness spacing and amplitude parameter.