半实物环境下嵌入式软件通用测试平台研究

Research on General Testing Platform for Embedded Software Under the Hardware-in-the-Loop Environment

嵌入式软件规模日益增大,结构也越来越复杂.当前嵌入式软件测试系统通常针对特定被测软件,从底层做起,没有一个通用平台提供支持.本文提出了一个半实物环境下嵌入式软件通用测试平台框架,采用基于Eclipse CDT/JDT的跨语言源代码分析,使用XML文档作为测试数据交换介质,结合半实物环境下目标机的可替换性,实现了测试平台的通用性,自动化程度较高.根据该框架建成的测试平台,支持对被测程序进行源代码分析、按类插桩、自动编译、测试数据分析等操作.

As the scale of embedded software becomes bigger day by day ,its structure gets more and more complex .Currently ,the testing system is generally developed for aspecific embedded software and its de‐velopment has tostart from scratch ,for no general platform is available w hich can support the test .In this paper ,a general testing platform frame under the hardware‐in‐the‐loop environmentis proposed .Cross‐lan‐guage source code analysis is made based on the application of Eclipse CDT/JDT .XML document is used as the exchange platform of the testing data .With the replace ability of the target machine ,a general plat‐form with high‐degree automation is realized .The functions of the testing platform include source code a‐nalysis ,probe insertion by test type ,automatic compilation and testing data analysis .