摘要
光子隧道像有较高的横向和纵向的分辨率,利用椭圆偏振术,测定晶体薄膜两主反射系数的椭偏参量,能够测定晶体薄膜的光子隧道像。
Photon tunneling image has high lateral and vertical resolutions. An ellipsometer is used to measure ellipsometer parameters of the ratio of the two main reflectances of crystal film, the parameters of the film are obtained and the photon tunneling image is given.
出处
《浙江工程学院学报》
2003年第4期286-288,共3页
Journal of Zhejiang Institute of Science and Technology
