摘要
本文采用数字处理技术对高速ADC的微分相位、微分增益的测试方法进行研究 ,给出了方程式 ,构建了数字测试系统 ,完成了高速ADC微分相位及微分增益的测试 ,该方法适用于大批量的ADC动态参数的测试 .
Test methods based on DSP for Differential Phase(DP) and Differential Gain(DG) of high speed and log to digital converter (ADC) are studied.And the equations are proposed.The ADC dgnamic test circuit has been built.The high speed ADC converter has been tested using the method;Examples of test results are shown that the method is suitable for measuring DP or DG of an ADC system.
出处
《电子学报》
EI
CAS
CSCD
北大核心
2003年第12期1897-1899,共3页
Acta Electronica Sinica
关键词
微分相位
微分增益
模数转换
数字处理
ADC
differential Phase
differential Gain
DSP
analog to ditital converters