摘要
讨论了主跃变测试法;LSB阶梯扫描,建立时间测试法;参考电流转换速率dI/dt测试法;阐明了DAC测试环境及自行设计DAC测试系统注意点;最后介绍了在实际工作中采用APPLE-Ⅱ微型计算机构成的DAC测试系统的结构和应用情况。
Techniques for D-A converter testing, such as main transition testing. LSB step scanning, set-up time testing and reference current slew rate dI/dt testing, are discussed in the paper. The environmental requirements for testing of D-A converters and considerations on self-designed system for DAC testing are described. Finally, our DAC testing system using an Apple-II microcomputer and its application in our work are introduced.
出处
《微电子学》
CAS
CSCD
1992年第5期8-14,23,共8页
Microelectronics
关键词
集成电路
数-模转换器
设计
测试
D-A converter, Analog IC, IC testing. DAC testing