期刊文献+

噪声参数传递标准件标准值的不确定度评定

Evaluation of Measurement Uncertainty of Noise Parameters Standards
下载PDF
导出
摘要 针对噪声参数测量系统的计量工作中,因缺乏噪声参数传递标准件不确定度量值所带来的困扰,推导了噪声参数传递标准件标准值的不确定度评定的测量模型,研究了蒙特卡洛法在噪声参数传递标准件标准值的不确定度评定中的应用,分配了测量影响量的概率密度函数。依托MATLAB开发平台,开发了专用的噪声参数不确定度评定软件,它可实现扫频、点频两种模式下,定制化噪声参数不确定度评定,计算结果包含噪声参数的标准值的最佳估计及不确定度,噪声参数标准值的分布图、包含概率等多种信息。文中给出了(2~6)GHz频段内噪声参数测量值和评定的不确定度的数据,经过对比验证,评定的不确定度结果合理有效。 The lack of uncertainty of noise parameters standards often impedes the calibration of noise parameters systems. In this paper, a measurement model for noise parameters standards was derived and the evaluating of measurement uncertainty of noise parameters standards using Monte Carlo method was proposed. Based on MATLAB Integrated Development Environment, we developed a dedicated software for evaluating noise parameters standards’ measurement uncertainty, and this software can customized noise parameters uncertainty in both sweep and point frequency modes. Furthermore, the calculation results include not only the best estimate of noise parameters and its uncertainty, but also the probability density distribution of standard Value of noise parameters. By comparison, the result was proved correct and reasonable.
作者 田秀伟 楼红英 霍晔 杨保国 段飞 吴爱华 TIAN Xiu-wei;LOU Hong-ying;HUO Ye;YANG Bao-guo;DUAN Fei;WU Ai-hua(The 13th Research Institute of China Electronics Technology Group Corporation,Shijiazhuang 050051,China;The 14th Research Institute of China Electronics Technology Group Corporation,Nanjing 210039,China;The Electronic Test&Measurement Laboratory,Qingdao 266555,China)
出处 《宇航计测技术》 CSCD 2018年第5期33-37,共5页 Journal of Astronautic Metrology and Measurement
基金 国家重点研发计划(2016YFF01022105)
关键词 噪声参数 蒙特卡洛法 不确定度评定 Noise parameters Monte Carlo method Uncertainty evaluating
  • 相关文献

参考文献4

二级参考文献26

  • 1叶德培,赵峰,施昌彦,等.JJF1059.1-2012测量不确定度的评定与表示[S].北京:国家质量监督检验检疫总局,2012:8-23.
  • 2Friis H. T. Noise Figure of Radio Receivers[C]//Pro-ceedings of IRE, 1944,32:419-22.
  • 3Agilent Technologies. Fundamentals of RF and Micro-wave Noise Figure Measurements [Agilent ApplicationNote57-l][R]. 2001.
  • 4V. Adamian, R. Fenton* Verification of the Noise Pa-rameter Instrumentation[C]//49 th ARFTG ConferenceDigest, Denver, co, June 1997 : 181-190.
  • 5S. Van den Bosch, L. Martens. Deriving Error Boundson Measured Noise Factors Using Active Device Verifi-cation [C]//54th ARFTG Conference Digest, Dec.1999.
  • 6A. Frazer, E. Strid. Repeatability and Verification ofOn-wafer Noise Parameter Measurements[J]. Micro-wavejournal, 1988(11).
  • 7E. C. Valk,D. Routledge, J. F. Vaneldik,et al. De-Embedding Two-Port Noise Parameters Using a NoiseWave Model [J]. IEEE Transactions on Instrumenta-tion and Measurement,1988,37(2) : 195-200.
  • 8V. Markovic,B. Milovanovic,O. Pronic, et al. Ex-traction of Noise Wave Sources in MESFET Wave Rep-resentations [ C ]//Microwave and Millimeter WaveTechnology Proceedings, 1998, ICMMT 98,Aug. 18-20,1998:108-111.
  • 9G. L. Williams. Measuring Amplifier Noise on aNoise Source Calibration Radiometer[J]. IEEE Trna-sactions on Instrumentation and Measurement, 1995,44(2):340-342.
  • 10Haus. Optimum Noise Performace of Optical Ampli-fers[J]. IEEE Quantam Electrionics, 2001,37(6):813-823.

共引文献3

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部