TFT-LCD横纹不良研究与改善

Analysis and improvement of TFT-LCD horizontal stripes defect

本文研究了一款TFT-LCD HADS产品出现的21.4%横纹不良。通过分析和改善研究表明,产生横纹的根本原因是V_(com)反馈信号与CLK_1、CLK_2、CLK_3信号产生耦合效应及V_(com)补偿电路共同作用下,导致V_(com)在栅压关闭前存在三上三下的周期性波动,形成三行暗三行亮水平粗纹;根据原理分析进行不良改善实验验证,最终通过调整降低V_(com)补偿电路倍数,将该不良降低至0%。

In this paper,we explore a kind of horizontal stripes defect which happened 21.4%in TFT-LCD HADS product.Through analysis and improvement study,the main reason for horizontal stripes defect was the coupling effect of Vcom Feedback signal and CLK1,CLK2,CLK3 signal,and Vcomcompensation circuit.As a result,there are three periodic fluctuations of Vcombefore Gate closing,which form three lines of dark and three lines of bright horizontal rough lines.According to the principle analysis,the defect improvement experiment is verified.Finally,by adjusting the Vcomcompensation circuit multiple,the defect is reduced to 0%.